Reduce the number of the generated KT tests (#2099)

Author: dmitriy-sobolev

test/kt/CMakeLists.txt

@@ -109,12 +109,14 @@ function(_generate_esimd_sort_tests _key_value_pairs)
                 if(_key_value_pairs)
                     foreach (_base_file ${_base_file_by_key_all})
                         foreach (_val_type ${_type_all})
-                            _generate_esimd_sort_test(${_base_file} ${_data_per_work_item} ${_work_group_size} ${_key_type} ${_val_type} 20)
+                            # ~1-2 tests: (2/1000) * (16 * 6 * 6 * 2)
+                            _generate_esimd_sort_test(${_base_file} ${_data_per_work_item} ${_work_group_size} ${_key_type} ${_val_type} 2)
                         endforeach()
                     endforeach()
                 else()
                     foreach (_base_file ${_base_file_all})
-                        _generate_esimd_sort_test(${_base_file} ${_data_per_work_item} ${_work_group_size} ${_key_type} "" 200)
+                        # ~1-2 test: (10/1000) * (16 * 6 * 2)
+                        _generate_esimd_sort_test(${_base_file} ${_data_per_work_item} ${_work_group_size} ${_key_type} "" 10)
                     endforeach()
                 endif()
             endforeach()
@@ -127,10 +129,11 @@ if (ONEDPL_TEST_ENABLE_KT_ESIMD)
     _generate_esimd_sort_tests(TRUE) # esimd_radix_sort_by_key, random
 
     # Pin some cases to track them
-    _generate_esimd_sort_test("esimd_radix_sort_by_key_out_of_place" "96" "64" "uint32_t" "uint32_t" 1000) # common use-case
+    _generate_esimd_sort_test("esimd_radix_sort_by_key_out_of_place" "96" "64" "uint32_t" "uint32_t" 1000)
+    _generate_esimd_sort_test("esimd_radix_sort" "384" "64" "int32_t" "" 1000)
 endif()
 
-function (_generate_gpu_scan_test _data_per_work_item _work_group_size _type)
+function (_generate_gpu_scan_test _data_per_work_item _work_group_size _type _probability_permille)
     if ((NOT TARGET build-scan-kt-tests) AND (NOT TARGET run-scan-kt-tests))
         add_custom_target(build-scan-kt-tests COMMENT "Build all scan kernel template tests")
         add_custom_target(run-scan-kt-tests
@@ -143,7 +146,7 @@ function (_generate_gpu_scan_test _data_per_work_item _work_group_size _type)
     set(_target_name "single_pass_scan_dpwi${_data_per_work_item}_wgs${_work_group_size}_${_type_short}")
     set(_test_path "single_pass_scan.cpp")
 
-    _generate_test(${_target_name} ${_test_path})
+    _generate_test_randomly(${_target_name} ${_test_path} ${_probability_permille})
     if(TARGET ${_target_name})
         add_dependencies(build-scan-kt-tests ${_target_name})
         add_dependencies(run-scan-kt-tests ${_target_name})
@@ -162,12 +165,18 @@ function(_generate_gpu_scan_tests)
     foreach (_data_per_work_item ${_data_per_work_item_all})
         foreach (_work_group_size ${_work_group_size_all})
             foreach (_type ${_type_all})
-                _generate_gpu_scan_test(${_data_per_work_item} ${_work_group_size} ${_type})
+                # ~1-2 test: (10/1000) * (6 * 5 * 6)
+                _generate_gpu_scan_test(${_data_per_work_item} ${_work_group_size} ${_type} 10)
             endforeach()
         endforeach()
     endforeach()
 endfunction()
 
 if (ONEDPL_TEST_ENABLE_KT_SYCL)
     _generate_gpu_scan_tests()
+
+    # Pin some cases to track them
+    _generate_gpu_scan_test("8" "512" "uint32_t" 1000)
+    _generate_gpu_scan_test("4" "256" "float" 1000)
+    _generate_gpu_scan_test("16" "64" "int64_t" 1000)
 endif()