Level testing formatting and updates.#66

Open

brandonboesch wants to merge 21 commits into

ARMmbed:level-testingfrom

brandonboesch:level-testing

Commits on Jul 14, 2017

Removed print statement from Level1/AnalogIn that I added earlier for debug purposes

brandonboesch
authored and
brandonboesch
committed
Fixed bug in BusInOut where it was calling level2 framework instead of level1. Formatted code

brandonboesch
authored and
brandonboesch
committed

Commits on Jul 17, 2017

added ifdef guards to TestFramework.cpp, so that it can compile with boards that don't have all the PinMaps defined

brandonboesch
authored and
brandonboesch
committed
changed printf to use hex instead if decimal when printing pin names

brandonboesch
authored and
brandonboesch
committed
Added #ifdef check in map_pins() so that it no longer adds ADC internal channels on STM boards, as they cause timeout errors when constructed

brandonboesch
authored and
brandonboesch
committed
Debug printf calls now report as hex instead of decimal for pin names on level1 tests.

brandonboesch
authored and
brandonboesch
committed
Fixed typo in DigitalIO.cpp. Turned of Debug mode in mbed_app.json

brandonboesch
authored and
brandonboesch
committed

Commits on Aug 4, 2017

Formatted Level0 code per Martin Kojtal's request.

brandonboesch
authored and
brandonboesch
committed

Commits on Aug 7, 2017

Formatted Level1 code per Martin Kojtal's requested format.

brandonboesch
authored and
brandonboesch
committed
Formatted TestFramework code per Martin Kojtal's requested format.

brandonboesch
authored and
brandonboesch
committed
Modified Level1/I2C. Removed assert testing on write and then read of null string, since the test was not really determining which of the two functions was failing individually. The remaining test …

brandonboesch
authored and
brandonboesch
committed

Commits on Aug 11, 2017

Updated assert checking for SPI and I2C Level1 tests, ensuring that Arduino pins are connected to shield properly. Removed unused code from Level1 DIO test.

brandonboesch
authored and
brandonboesch
committed

Commits on Aug 14, 2017

Formatted Level2 tests to match mbed style guide.

brandonboesch
authored and
brandonboesch
committed
Finished testing and updating Level2 AnalogIn.

brandonboesch
authored and
brandonboesch
committed

Commits on Aug 16, 2017

Updated level1-spi test so that it no longer checks the cs pin in the CS pinmap, but rather the DigitalIO pinmap, per response of issue that I raised here: https://github.com/ARMmbed/mbed-os/issues…

brandonboesch
authored and
brandonboesch
committed
Updated level2-spi and level3-spi tests so that they no longer checks the cs pin in the CS pinmap, but rather the DigitalIO pinmap, per response of issue that I raised here: https://github.com/ARMm…

brandonboesch
authored and
brandonboesch
committed

Commits on Aug 17, 2017

Level2-DIO test was only running 6 tests on the K64F instead of the intended 8 (one for each DIO pin that has a pin pair). Debugged issue and found that 2 of the DIO pins mapped to the Arduino Head…

brandonboesch
authored and
brandonboesch
committed
Finished testing level2/i2c. The logic used to test if write and read occured was not accurate, and not really necessary for the test to begin with, so was removed.

brandonboesch
authored and
brandonboesch
committed
Removed the UART pins from DIO since having DEVICE_SERIAL defined, does not guarantee that UART_RTS and UART_CTS pins are defined in PeripheralPins.c, which will cause compile time errors if they a…

brandonboesch
authored and
brandonboesch
committed
Finished testing level2-pwm

brandonboesch
authored and
brandonboesch
committed

Commits on Aug 18, 2017

Finished testing level2/Spi. Should be finished testing all of level 2 now.

brandonboesch
authored and
brandonboesch
committed