Refactor MaterialScan*_genericAngle into MaterialScan_2D

[jmcarcell]

The current status of things is that we have 3 different services for doing a material scan

• The original: MaterialScan, that only allows binning in eta
• MaterialScan_genericAngle: that allows binning in eta, theta, costheta and uses a random phi (only between 0 and 90 degrees)
• MaterialScan_2D_genericAngle: same as above, except it allows binning in phi

This is not great as the code does pretty much the same thing in all three cases with some variations. I propose then to have a single service for doing material scanning. For that, we can use MaterialScan, adding the properties that it doesn't have and deprecating MaterialScan_genericAngle and MaterialScan_2D_genericAngle, removing them later in the future. One key difference is that now phi will not be random like before (both in the old MaterialScan and MaterialScan_genericAngle, which in my opinion is better as I believe different results would be obtained when running multiple times.

BEGINRELEASENOTES

• Copy the code of MaterialScan_2D_genericAngle into MaterialScan, doing a bit of cleanup and preserving the old properties of MaterialScan, that now emit a deprecation warning if used
• Deprecate MaterialScan_genericAngle and MaterialScan_2D_genericAngle

ENDRELEASENOTES